Off-axis reflection zone plate for quantitative soft x-ray source characterization
نویسندگان
چکیده
A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate l/Dl>1000 spectral resolution and absolute flux and brilliance measurements. © 1997 American Institute of Physics. @S0003-6951~97!04828-6#
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